Fig. 1: Ptychographic atomic electron tomography (PAET) of a complex nanostructure.

a A converged electron beam is scanned over a nanoscale sample which is tilted around the α axis of a high-precision tomography holder. Four-dimensional scanning diffraction datasets are recorded at every tilt angle using a direct electron detector. b Reconstructed complex wave function of an example STEM probe. c Examples of phase-contrast projection images, reconstructed using mixed-state electron ptychography. d High-SNR class averages calculated from the images in (c). e Average diffraction pattern of all 36 tilt angles with some scattering angles labeled. f Two orientations of the 3D reconstructed volume from the 2D unit cell averages in (d). All real space scales bars are 10 Å, scale bar in (e) is 0.5 Å⁻¹.