Fig. 2: Compositional heterogeneity and microstructure measured by FE-SEM and EDS.

a–i The backscattering diffraction (BSD) image and the corresponding elemental distribution of BNT-BZT-xGaN with x = 0.1 wt%.

a–i The backscattering diffraction (BSD) image and the corresponding elemental distribution of BNT-BZT-xGaN with x = 0.1 wt%.