Fig. 3: Crystal structure measured by XRD and the Rietveld refined data calculated by the GSAS-EXPGUI software. | Nature Communications

Fig. 3: Crystal structure measured by XRD and the Rietveld refined data calculated by the GSAS-EXPGUI software.

From: Thermoelectric coupling effect in BNT-BZT-xGaN pyroelectric ceramics for low-grade temperature-driven energy harvesting

Fig. 3

a The XRD patterns of BNT-BZT-xGaN ceramics with various contents of GaN, b the magnified XRD peaks at ~40.0° and 46.5° for BNT-BZT-xGaN samples with x = 0–0.2 wt%, c the Rietveld refined lattice parameters (a, b, c, α, β, γ) and distance of Ti-O for BNT-BZT-xGaN samples with various contents of GaN, and d the structural images of BNT-BZT and BNT-BZT-xGaN samples, respectively.

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