Fig. 6: Dielectric and ferroelectric properties measured with dielectric properties testing system and ferroelectric analyzer system. | Nature Communications

Fig. 6: Dielectric and ferroelectric properties measured with dielectric properties testing system and ferroelectric analyzer system.

From: Thermoelectric coupling effect in BNT-BZT-xGaN pyroelectric ceramics for low-grade temperature-driven energy harvesting

Fig. 6

a The temperature-dependent dielectric constant (εr) and loss (tanδ) for BNT-BZT-xGaN samples with various content of GaN in the temperature range of 25–400 oC, b the temperature of ferroelectric-paraelectric phase transition (Tm), ergodic relaxor-ferroelectric state (Ts), non-ergodic to ergodic relaxor state (TFR), εr and tanδ of BNT-BZT-xGaN samples with x = 0–0.2 wt%, c the P-E hysteresis loops, and d the saturation polarization (Ps), remnant polarization (Pr) and coercive electric field (Ec) of BNT-BZT-xGaN samples with various content of GaN at room temperature.

Back to article page