Fig. 5: In situ XAFS measurements in 0.1 M HClO4 (pH = 1). The loading of catalysts is 1 mg cm−2, and the solution resistance 2.2 Ω. | Nature Communications

Fig. 5: In situ XAFS measurements in 0.1 M HClO4 (pH = 1). The loading of catalysts is 1 mg cm−2, and the solution resistance 2.2 Ω.

From: Tensile straining of iridium sites in manganese oxides for proton-exchange membrane water electrolysers

Fig. 5: In situ XAFS measurements in 0.1 M HClO4 (pH = 1). The loading of catalysts is 1 mg cm−2, and the solution resistance 2.2 Ω.The alternative text for this image may have been generated using AI.

a In situ XANES spectra of Ir L3-edge for TS–Ir/MnO2 at typical potentials during OER. b Corresponding k2-weighted FT-XAFS spectra. c Fitted curves and d OER mechanism diagrams of TS–Ir/MnO2 under ex situ, 1.30 and 1.43 V conditions. The inset shows Mn, O, Ir, and H atoms indicated by purple, red, green, and royal blue, respectively.

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