Fig. 2: Oxygen sublattices in Pr0.8Sr0.2NiO3 and Pr0.8Sr0.2NiO2+x films.
From: Direct observation of strong surface reconstruction in partially reduced nickelate films
ABF images of a Pr0.8Sr0.2NiO3 and c Pr0.8Sr0.2NiO2+x films. b Enlarged ABF images and the corresponding schematic structural models (below) show the variation of oxygen octahedra in the pristine sample. DNi-O indicates the relative displacement of Ni and O. d Enlarged ABF images and the corresponding schematic structural models (right) show the variation of oxygen octahedra in the reduced sample. e The relative displacement of Ni and O at the NiO2 plane in the out-of-plane direction. The schematic atomic structure at the PrNiO3/NdGaO3 interface. The error bar is calculated by averaging multiple unit cells on each row.
