Fig. 1: Characterization of as-built surfaces of a LPBF 316L SS plate.

a Scanning electron microscopy (SEM) images, taken with secondary electron, showing the surfaces topography for two different surface orientations. The insets show higher magnification images highlighting defects. The SEM images are referred to an optical images montage to show their respective orientation compared to the build direction. b, c SEM energy dispersive X-ray spectroscopy elemental maps for the top and side surfaces, respectively. Elemental maps for Fe, Cr, and Ni are presented in Supplementary Fig. 1a and b, respectively.