Fig. 8: Transmission electron microscopy (TEM) characterization after open circuit potential testing of the native surface oxide found away from slags or partially melted regions. | Nature Communications

Fig. 8: Transmission electron microscopy (TEM) characterization after open circuit potential testing of the native surface oxide found away from slags or partially melted regions.

From: Critical role of slags in pitting corrosion of additively manufactured stainless steel in simulated seawater

Fig. 8

a Scanning TEM (STEM) high angle annular dark field (HAADF) and STEM energy dispersive X-ray spectroscopy (EDS) maps of the corroded surface oxide. b STEM/EDS line analysis along the red dashed line drawn in (a).

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