Fig. 4: In situ XAFS and in situ XRD results. | Nature Communications

Fig. 4: In situ XAFS and in situ XRD results.

From: A surface strategy boosting the ethylene selectivity for CO2 reduction and in situ mechanistic insights

Fig. 4

Fourier transform curves of in situ EXAFS at the Cu K-edge of the (a) CuO-SH and (b) CuO obtained in a potential window −1 to −1.6 V, c Coordination numbers of the first intermetallic Cu–Cu shell (error bars represent the fit error), In situ XRD patterns of (d) CuO-SH and (e) CuO collected at various potentials ranging from 0 to −1.4 V, f Quantitative peak analysis: the ratio of Cu(100) and Cu(111) facets (error bars indicate the standard deviation of three independent measurements).

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