Fig. 4: Flicker noise measurements.
From: Photooxidation driven formation of Fe-Au linked ferrocene-based single-molecule junctions
a Single conductance versus time trace for a flicker noise measurement of 1 at 450 mV. During the measurement, the molecular junction is held for 150 ms (dark red region). Inset: the noise power spectral density (PSD) obtained by taking the modulus square of the discrete Fourier transform of the hold segment. b 2D histogram of integrated normalized flicker noise power versus average junction conductance for 1L (at 150 mV) and 1H (at 450 mV). Conductance regions corresponding to 1L and 1H are indicated with blue and red sections respectively. The exponents describing the relationship between integrated flicker noise and conductance are as follows; 1.28 for 1L and 1.30 for 1H.
