Fig. 5: Statistical and detailed characterization of O-anion.
From: Efficient direct repairing of lithium- and manganese-rich cathodes by concentrated solar radiation
HAADF-STEM and EELS O K-edge line scan spectra of LMRO-50C (a) (the area inside the dotted line is CEI species) and LMRO-50CS (b) along the direction of the arrow, from the surface to the bulk. c Local mRIXS map plotted at around 531 eV of LMRO-50CS and LMRO-50CS under different charge/discharge voltages, the red arrow marks the characteristics of oxygen oxidation that emerges at around 531 eV excitation energy and 523.7 eV emission energy. d Integrated RIXS intensity in characteristic energy range, from 530.5 to 531.5 eV. e The quantification of the integral area of the yellow shadow area in (d). The (CC) represents the Charging state, the (DC) represents the Discharging state and the (CSR) represents the sample after CSR treatment.
