Fig. 1: Application of PSF engineering onto an HTP microscope objective.
From: Depth-enhanced high-throughput microscopy by compact PSF engineering
A Application external to the objective via a metal mount, onto which a phase mask is glued. B Application onto the objective using a 3D printed phase mask mount that attaches to the internal thread of the objective thread adapter. C Alternative EDOF design generated by stacked glasses rather than a phase mask. It is applied internally to the objective, similarly to the bottom element in panel B. D Depiction of three microspheres distributed in a 3D volume. Axial positions are +30, 0, and −35 µm, relative to the focal plane, marked in gray. E Simulated image of the microspheres from D by a standard HTP microscope. F Simulated image of the microspheres by an HTP microscope with a modified objective lens as shown in panel B. Lookup-table is the same as in panel E. Scalebar is 20 μm. The simulated PSF is a Tetrapod. A color-coded image of the phase pattern used is shown in Fig. 4A.
