Fig. 2: Fluorescent bead imaging with EDOF.
From: Depth-enhanced high-throughput microscopy by compact PSF engineering
A y–z projection of the standard and EDOF PSFs, simulation and experimental. LUT is adjusted per projection. B Curves depicting the broadening of the PSFs as a function of defocus, generated from a statistical ensemble analysis. C Histograms of the number of localizations per PSF width, from the whole z-stack. D An ROI of the dense bead sample at various z-positions. Top row—standard PSF, middle row—EDOF. Yellow arrowheads mark beads that can only be colocalized with the EDOF PSF imposed. Imaging depth is specified above each column. The bottom row shows intensity profiles of the horizontal lines, with a Gaussian fit where applicable (the standard PSF profile of z = 280, 290 μm is not Gaussian). FWHM of the Gaussian profiles is specified near each plot, where FWHM ≈ 2.36σ. In the legend, “St.” stands for the standard PSF. All scale bars are 20 μm. Source data are provided as a Source Data file.
