Fig. 3: The Kondo effect in device N2.

a The low-temperature resistance upturn measured in the circular disc device N2. The black solid line indicates the fitting curve from 1.8 to 25 K using Eq. (1). Inset: The optical image of device N2. b The temperature dependence of resistance measured under several magnetic fields applied along the z-axis. c Negative magnetoresistance (MR) under magnetic fields along different directions at 1.8 K when the current is applied along the x-axis. d Negative magnetoresistance under magnetic fields along different directions at 1.8 K when the current is applied along \(\theta={45}^{\circ }\) and \({135}^{\circ }\). Source data are provided as a Source Data file.