Fig. 3: Plasmons on a 380-nm-thick flake of CsV3Sb5.
a–d Images of the near-field amplitude \(s\left(\omega \right)\) at four different frequencies on a 380-nm-thick crystal. The scale bar is 5 μm in length. e Line-profiles of the extracted near-field scattering amplitude at these frequencies. Dashed lines representing fits using the formula described in the main text. f The in-plane dielectric function \({\epsilon }_{{ab}}(\omega )\) of CsV3Sb5 obtained from far-field optical reflectivity measurements43 and the frequency-dependent quality factors Qp\((\omega )\) of the plasmons obtained from the line profiles. The error bars represent the 90% confidence intervals.
