Table 1 Summary of the hBN samples used in this work

From: Multi-species optically addressable spin defects in a van der Waals material

Sample description

Irradiation

Presence of C? defects

Max. ODMR contrast

Sample morphology for measurements

Nanopowder (Graphene Supermarket)

2 MeV electrons

High density as purchased

−1.0% (batch 1)

powder film,  ~1–10 μm thick (Fig. 1)

   

+1.0% (batch 2)

powder film,  ~ 1–10 μm thick (Supplementary Fig. 19)

Bulk crystal (HQ Graphene)

2 MeV electrons

Low density as purchased, high density after irradiation

+0.5%

whole crystal,  ~100 μm thick (Fig. 3)

    

exfoliated flake,  ~1 μm thick (Fig. 2)

MOVPE film21

none

High density as grown

+0.5%

film,  ≈40 nm thick (Fig. 4)

  1. Column 3 indicates the qualitative density of C? defects (low/high density means single emitters can/cannot be resolved). Column 4: Maximum CW-ODMR contrast observed for the C? defects.