Fig. 3: Characterization of BP thin films. | Nature Communications

Fig. 3: Characterization of BP thin films.

From: A clean transfer approach to prepare centimetre-scale black phosphorus crystalline multilayers on silicon substrates for field-effect transistors

Fig. 3: Characterization of BP thin films.

Atomic force microscopy (AFM) height profile of BP thin films (a) directly grown on mica substrate and (b) wet-transferred onto the SiO2/Si substrate. Inset: corresponding AFM images showing the topography of BP thin films. The squared areas marked in the AFM images were used to deduce the roughness presented in (a) and (b). c X-ray crystallography (XRD) patterns of bare mica substrate, as-grown BP and wet-transferred BP. d Raman spectra of BP thin films before (on mica substrate) and after (on SiO2/Si substrate) wet transfer.

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