Fig. 1: Crystal structure of CRO films grown on LAO substrate.
From: Generation of out-of-plane polarized spin current by non-uniform oxygen octahedral tilt/rotation
a HAADF image of the cross-section of CRO (14 nm)/LAO, recorded along the [110] zone axis. The interfaces are marked by red dashed line, showing clearly layered structures and atomically sharp interface. b ABF image of CRO (14 nm)/LAO, the interface is marked by red dashed line. The colored diagrams depict the tilted octahedra. c Averaged Ru-O-Ru bond angle Φ (left) and displacements of O anion xO (right) plotted as a function of the pseudo-cubic CRO layer. The error bars denote the standard deviation of multiple measurements. The Ru-O-Ru band angle Φ and the displacements of O anion xO are sketched in the inset plots. d XRD spectra of the CRO films with the thickness of 14 nm. The black arrow marks the (001) diffraction peak of CRO layers.
