Fig. 1: Genetic architecture of shattering resistance in soybeans.

a Photographic illustration of pod dehiscence in Williams 82, PI 468916, and PI 479752. Bar = 1 cm. b Statistics of dehisced pods in Williams 82, PI 468916, and PI 479752, and F₁ pod derived from the crosses of Williams 82 × PI 468916 and Williams 82 × PI 4479752, respectively. c QTL mapping result using the RIL population derived from Williams 82 x PI 468916. The y-axis indicates the logarithm of the odds (LOD) score, and the x-axis indicates chromosome. The gray line indicates the significant threshold LOD determined by 1,000 permutations at significant level of 0.05. d QTL mapping result using the RIL population derived from Williams 82 x PI 479752. The y-axis indicates the LOD score, and the x-axis indicates chromosome. The gray line indicates the significant threshold LOD determined by 1,000 permutations at significant level of 0.05. e Genome-wide association mapping results using a natural population including ~3000 soybean landrace accessions randomly selected from the USDA Soybean Germplasm Collection. The gray dashed line indicates the significant threshold value determined by Bonferroni correction. n = 3 biological samples for Fig. 1b. Data are presented as mean values ± SD. Source data are provided as a Source Data file.