Fig. 1: Schematics of diffraction imaging measurements. | Nature Communications

Fig. 1: Schematics of diffraction imaging measurements.

From: Understanding the origin of lithium dendrite branching in Li6.5La3Zr1.5Ta0.5O12 solid-state electrolyte via microscopy measurements

Fig. 1

a shows the DFXM setup. This study focuses on the observation of dislocation structures at the tip of a dendrite projected from the 532 Bragg reflection using diffraction contrast to obtain comprehensive 3D information. b DFXM images were collected for 2D layers by employing a line-focused beam with a beam profile of 600 nm full width at half maximum (FWHM) in the z direction. The sample was scanned vertically in the z direction to capture variations along the crystal’s height. The direction of the scattering vector can be adjusted through the two tilts (ϕ and χ), and the length of the scattering vector can be modified using a combined ϕ-2θ scan. c shows the schematics of nearfield topography measurements with a box-shaped incident beam. This imaging modality provides a larger field of view (1.2 mm × 1.2 mm) with lower spatial resolution (on the order of 1.5 μm) and no z resolution, as the entire diffracted volume is projected onto the nearfield detector.

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