Fig. 3: In situ field-dependent structural characterization.

a Schematics of the measurement setup and the scattering vectors with respect to the applied field. Contour plots of b {111}pc and c {200}pc reflections of PIC151 and PZT-PMN. d Schematic of the center of mass (the average 2θ position weighted according to their intensities) of {200}pc reflections for the calculation of field-dependent electrostrains12. The calculated electrostrains based on the e {111}pc and f {200}pc reflections using the center of mass method.