Fig. 2: Structural and electronic characterization of the as-fabricated photocatalysts.

a Partially enlarged XRD patterns within the diffraction angle range of 35°–38°. b Raman spectra. c The AC-HAADF-STEM image of Ce_0.6%-ZnO. d, e EXAFS spectra of Ce L₃-edge (d) and Zn K-edge (e). f O₂-TPD of ZnO and Ce_0.6%-ZnO.