Fig. 3: Polarization-resolved photoluminescence microscopy. | Nature Communications

Fig. 3: Polarization-resolved photoluminescence microscopy.

From: Influence of resonant plasmonic nanoparticles on optically accessing the valley degree of freedom in 2D semiconductors

Fig. 3

a Measured confocal scans of valley-specific emission intensities \({{{\mathcal{I}}}}_{{\sigma }^{\pm }}\) from embedded 1L-MoS2 decorated with monodispersed GNPs upon σ+ excitation and collected through a 660 nm bandpass filter. b Total intensity \({{{\mathcal{I}}}}_{{{\rm{tot}}}}=\left({{{\mathcal{I}}}}_{{\sigma }^{+}}+{{{\mathcal{I}}}}_{{\sigma }^{-}}\right)\) and (c) degree of circular polarization \({{\rm{DOCP}}}=\left({{{\mathcal{I}}}}_{{\sigma }^{+}}-{{{\mathcal{I}}}}_{{\sigma }^{-}}\right)/{{{\mathcal{I}}}}_{{{\rm{tot}}}}\) scans as calculated from the results shown in (a).

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