Fig. 2: Critical adhesion of suspended graphene compared to that of bulk graphite.
From: Many-body van der Waals interactions in multilayer structures studied by atomic force microscopy
a Schematic of the AFM measurements taken over suspended graphene. b AFM topography of graphene suspended over a graphite hole of 2.5 μm diameter. The white line denotes scale bar, 1 μm. c Histogram distribution of the ratio of critical adhesion forces measured on top of suspended monolayer graphene (Pmono) to Pbulk. The blue curve is a Gaussian fit with a mean value of 0.96 and a standard deviation of 0.028.
