Fig. 2: TEM and HAADF-STEM images of In-O-MoS2@Ru.

a Bright-field HRTEM image of In-O-MoS2@Ru. b High-angle annular dark-field STEM image of In-O-MoS2@Ru. c Inverse FFT pattern of zoomed-in the high-angle annular dark-field STEM image at the In-O-MoS2@Ru interface area in Fig. 2b. d FFT patterns of In-O-MoS2@Ru for Fig. 2c. e The simulated diffraction patterns of Fig. 1d. f High-angle annular dark-field STEM image of In-O-MoS2@Ru at another area. g Inverse FFT pattern of zoomed-in the high-angle annular dark-field STEM image at the In-O-MoS2@Ru interface area in Fig. 2f. h FFT patterns of In-O-MoS2@Ru for Fig. 2g. i The simulated diffraction patterns of Fig. 2h. j Element mapping images for In-O-MoS2@Ru.