Fig. 3: Cross-linking and defects passivation.

a FITR spectra in selected region for the DVS solvent, as-cast DVS-based perovskite film, and DVS-gly based perovskite final film after annealing. b MALDI-TOF-MS measurement for the DVS/gly mixture solution. c–d GI-XRD spectra in 2θ–sin2ψ mode for (c) control and (d) DVS-gly based perovskite films at near surface region (50 nm depth), respectively. e In-depth XPS spectra for the DVS-gly-based perovskite film. f TRPL decay for the control, DVS, and DVS-gly based perovskite films.