Fig. 2: Characterization of Ni1Pd1/CeO2.

a XRD patterns of (i) Ni1Pd1/CeO2, (ii) CeO2, (iii) the powder diffraction file of Pd metal (file No. 8796), (iv) the powder diffraction file of Ni metal (file No. 8783), (v) the powder diffraction file of NiO (file No. 5898), and (vi) the powder diffraction file of CeO2 (file No. 11). b XPS spectrum of Ni1Pd1/CeO2 in the region of 332–344 eV (Pd 3d). c XPS spectrum of Ni1Pd1/CeO2 in the region of 849–867 eV (Ni 2p). The black line indicates the original spectrum, the blue, red, and orange broken lines indicate the deconvoluted signals and the green broken line indicates the sum of the deconvoluted signals. d Pd K-edge XANES spectrum. e Ni K-edge XANES spectrum. f STEM image and particle size distribution of Ni1Pd1/CeO2 (average = 2.6 nm; standard deviation, σ = 0.8 nm, n = 256). g HAADF-STEM image and elemental mapping of Ni1Pd1/CeO2 by EDS analysis. For the above analyses, Ni1Pd1/CeO2 was pre-treated with 1 atm of H2 at 150 °C for 0.5 h.