Fig. 1: Principle and process of tilt-coupled multislice electron ptychography (TCMEP).
a Schematic of the experimental setup for TCMEP, where the sample is tilted by a small angle θ relative to the zone axis. Multiple datasets are acquired under different tilt conditions during the experiment. b Illustration of how TCMEP enhances depth resolution. The upper panel shows the sample tilted by angle θ from the zone axis. The middle panel depicts the corresponding information transfer in Fourier space, represented as a cone with an effective semi-angle βMEP for 3D information transfer. The lower panel demonstrates how coupling datasets from different tilts broadens the information transfer limit, effectively increasing the semi-angle to βTCMEP, thereby improving depth resolution. c Flowchart of the TCMEP reconstruction algorithm, involving parallel processing of all datasets to optimize a single multilayer object.
