Fig. 4: Experimental imaging of Pr dopants in the (Pr0.05Ca0.95)2Co2O5 thin film. | Nature Communications

Fig. 4: Experimental imaging of Pr dopants in the (Pr0.05Ca0.95)2Co2O5 thin film.

From: Sub-nanometer depth resolution and single dopant visualization achieved by tilt-coupled multislice electron ptychography

Fig. 4: Experimental imaging of Pr dopants in the (Pr0.05Ca0.95)2Co2O5 thin film.The alternative text for this image may have been generated using AI.

a Structural model of the (Pr0.05Ca0.95)Co2O5 film grown on a LaAlO3 substrate. Two distinct Ca atom rows are marked by blue (Ca1) and red (Ca2) arrows, respectively. b, c Simultaneously acquired high-angle annular dark-field (STEM-HAADF) image (b) and Pr M5-edge intensity map from STEM-EELS (c). The Ca2 rows are marked by red arrows, as identified in the HAADF image. d Projected phase image reconstructed using MEP without sample tilting. e Depth profiles along the arrows in (c) for Ca1 (left) and Ca2 (right). f Statistical results of phase values for Ca1 and Ca2 sites from MEP results. g Projected phase image of the same region reconstructed using TCMEP with a maximum tilt of 1°. h Depth profiles corresponding to (e) for Ca1 (left) and Ca2 (right). A vertical black arrow highlights a 4 nm depth difference between two adjacent peaks in the Ca2 column, demonstrating the enhanced depth resolution achieved with TCMEP. i Statistical results of phase values for Ca1 and Ca2 sites from TCMEP results. Scale bars, 1 nm.

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