Fig. 2: Phase, structures, and compositions of Ag2Se thin films.
From: Advancing Ag2Se thin-film thermoelectrics via selenization-driven anisotropy control
a Grazing incidence diffraction GIXRD patterns (2θ mode) of Ag2Se thin films prepared at different Se precursor contents x (x = 15, 10, 5, and 2.5 mol). The 2θ ranges from 20° to 60°. b Symmetric mode (θ−2θ mode) of Ag2Se thin films prepared at different Se precursor contents x (x = 15, 10, 5, and 2.5 mol). The 2θ ranges from 20° to 60°. c X-ray photoelectron spectroscopy (XPS) spectra of Ag 3d3/2 and Ag 3d5/2 for the thin film with x = 10 mmol. Scanning electron microscopy (SEM) images of thin films with d x = 2.5 mmol and e x = 10 mmol from top views. The insets show corresponding SEM images from cross-sectional views. f SEM backscattered electron (BSE) image along with corresponding energy dispersive X-ray spectroscopy (EDS) maps of g Ag and h Se in the film with x = 10 mmol.
