Fig. 3: Reduced ρc from increased carrier concentration for enhanced electron tunneling.
From: Self-optimized contact in air-robust thermoelectric junction towards long-lasting heat harvesting

a Schematic diagram of structural changes in Sb/MgAgSb with aging; b XRD patterns of Mg1-xAgSb and c probe distance dependence of resistance in Sb/Mg1-xAgSb TE junctions; d DOS of MgAgSb, Ag3Sb and Sb; temperature dependence of e S and f σ of Mg1-xAgSb; energy band diagram of the contact between metal and g normal p-type semiconductor, h p-type semiconductor with increased n and i p-type semiconductor with a high n layer, specifically for the diagram in Sb/MgAgSb after aging.