Fig. 2: Materials characterization.

a XRD pattern of Bi-MOF, Bi-MOF-MF, and Bi-MOF-TS. b FT-IR analysis of Bi-MOF, Bi-MOF-MF, and Bi-MOF-TS. c The Bi L3-edge EXAFS spectra of Bi-MOF, Bi-MOF-MF, and Bi-MOF-TS. Bulk Bi foil and Bi2O3 are listed as references. HAADF-STEM image of Bi-MOF-MF (d) and Bi-MOF-TS (e). Schematic illustration of the crystal structure of Bi-MOF (f), Bi-MOF-MF (g), and Bi-MOF-TS (h). The structure models are proposed from based on the results of XRD, FT-EXAFS, and FT-IR. Source data for Fig. 2a, b, and c are provided as a Source Data file.