Fig. 5: AC-STEM characterization of SnSe before and after Te/Mo co-doping.

a ADF-STEM image of pristine SnSe viewed along [010] direction, inset showing the corresponding FFT spectrum. b ABF-STEM image of doped SnSe with an array of darker features induced by strain. c ADF-STEM image of a representative strained region, and d enlarged ADF-STEM image showing a distorted region in the lattice. e Intensity profile from boxed region in panel (d) (from left to right). f1, f2 Boxed region indicated in panels (a) and (c), respectively, showing enhancement in symmetry and decrease in θ after Te/Mo co-doping, overlaid by Sn and Se atom models. Double arrows indicate the distance between the farthest-neighboring Se-Sn pair. g1, g2 IFFT image using only (002) reflections and (400) reflections from panel (d), respectively. h1, h2 GPA of panel (d).