Fig. 6: Extraction of image differences between events over a large range of interval.

a A schematic diagram showing how a ferroelectric capacitor array is used to extract image differences. b A schematic diagram showing how a ferroelectric capacitor array is used to identify defective dies on a silicon wafer. c–f A schematic diagram showing how a ferroelectric capacitor array is used to assess the change in track direction. The track direction is to the right (closed switch) in (c) image and it is forward (open switch) in (d) image. If the track direction is changed from right to front, a clear image differences can be obtained using ferroelectric domain switching signals (e). However, if the track direction is always to the right, a clean blue image is then obtained without ferroelectric domain switching signals (f).