Fig. 3: Analyses of dielectric change rate, in-situ synchrotron X-ray diffraction, domain structure, and elements mapping. | Nature Communications

Fig. 3: Analyses of dielectric change rate, in-situ synchrotron X-ray diffraction, domain structure, and elements mapping.

From: Giant intrinsic electrocaloric effect in ferroelectrics by local structural engineering

Fig. 3: Analyses of dielectric change rate, in-situ synchrotron X-ray diffraction, domain structure, and elements mapping.The alternative text for this image may have been generated using AI.

a Temperature dependence of dielectric change rate with temperature (∂εr/∂T) at the low-temperature side of the Curie temperature for BST-xBSS. b Comparison of ∂εr/∂T, −∂P/∂T, and ΔT/ΔE at the low-temperature side of the Curie temperature for BST-0.08BSS. c In-situ synchrotron X-ray diffraction patterns of (111) and (200) reflections under 0 kV/cm (unpoled state), applying the electric field of 3 times the Ec (poling state), and 0 kV/cm (poled state), and the evolution of patterns intensity for BST-0.08BSS. d Transmission electron microscopy (TEM) images showing multiscale domain structure with domain widths from several nanometers to hundreds of nanometers. e Statistics of the width of representative domains marked by solid white lines in the TEM images. f Microscopic element mappings of O, Ba, Ti, Sn, and Sr elements.

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