Fig. 2: X-ray investigations.
From: Copper ion diffusion by solid solution treatment advancing GeTe-based thermoelectrics
a In situ heating XRD of Ge0.85Sb0.10Te (lower) and GST + 0.01Cu (upper) from 300 to 875 K. b Rietveld refinement of GST, GST + 0.01Cu, and GST + 0.04Cu. c Refinement of the local ranged PDF patterns of GST, GST + 0.01Cu, and GST + 0.04Cu from a 0 to 20 Å radial distance (r). d−f Refined dependencies of lattice parameter c, and the atomic displacement parameters at Ge sites with increasing rmax for GST, GST + 0.01Cu, and GST + 0.04Cu at U11 and U33. g Full XPS surveys of GST and GST + 0.01Cu. The inset shows the detailed survey of GST + 0.01Cu from 926 to 960 eV. h XANES spectra of GST and GST + 0.01Cu. The inset shows the corresponding EXAFS spectra scoping 1.5 to 3 Å.
