Fig. 4: Reliability performances for the Pt/LSMO/CeO2-x/HZO/LSMO capacitor.
From: Fatigue-free ferroelectricity in Hf0.5Zr0.5O2 ultrathin films via interfacial design
a Endurance and fatigue behaviors for the LSMO/CeO2-x/HZO/LSMO device at different cycling frequencies. b Polarization–electric field loops of the capacitor at different cycling stages. c Comparison of the endurance and fatigue manners for different HZO-based planar capacitors. d–f Retention results (recording the normalized switchable polarizations (Norm.Psw) as a function of baking time), temperature stability and overall comparisons of electric performances for HZO capacitors with different interfacial designs.
