Fig. 2: Nanoscale electron diffraction (ED) mapping of the stretched unfilled IR.
From: Self-reinforcement in filled rubber via strain-induced crystallisation
a Schematic of the annular dark-field scanning transmission electron microscopy (ADF-STEM) imaging and nanoscale ED mapping system. b ADF-STEM image of the boxed area in Fig. 1d (ε = 5.8). The black arrow indicates the stretching direction. c ED patterns obtained from the purple-box-enclosed region in (b). Each pattern was measured over an area of 40 × 40 nm. d ED pattern integrated over an area of 200 × 200 nm, corresponding to the twenty-five 40 nm ED patterns in (c). e Diffraction pattern integrated across the entire rubber region in (b). f Background and maximum intensity histograms for crystallite detection using 200 spots in 40 nm ED patterns. g Spatial distribution of the strain-induced crystallites detected using 200 spots.
