Fig. 1: The microscopic characteristics of representative studied grains.
From: Million-year solar wind irradiation recorded in chang’E-5 and chang’E-6 samples
a Secondary electron (SE) image of the studied CE6-PL1 grain. The green rectangle indicates the FIB cross-section site. b, d STEM and HRTEM image of the studied grain surface, black dashed line represents the boundary between the amorphous rim and the matrix (c) STEM, quantitative TEM-EDS maps, and corresponding TEM-EDS profiles of space weathering rim. The white arrow and white dashed box indicate the vapor-deposited rim and solar wind (SW)-damaged rim, respectively. Note that FIB, STEM, HRTEM, and TEM-EDS are abbreviations for Focused Ion Beam, Scanning Transmission Electron Microscopy, High-Resolution Transmission Electron Microscopy, and Transmission Electron Microscopy-Energy Dispersive X-ray Spectroscopy, respectively.
