Fig. 1: XRD characterization of the BTS thin films.
From: Engineering polar nanoclusters for enhanced microwave tunability in ferroelectric thin films
Fitted XRD profiles for a BTS800 thin film, b BTS850 thin film, and c BTS900 thin film, with Bragg peak positions indicated by black markers for Pt (upper), BTS (middle), and Si (lower).The cross-sectional SEM images of d BTS800 thin film, e BTS800 thin film, and f BTS900 thin film grown on the Pt/Ti/SiO2/Si substrate. g Fitted XPS spectra of Ba 3 d, O 1 s, Sn 3 d, and Ti 2p for studied films.
