Fig. 4: STEM characterization results.
From: Engineering polar nanoclusters for enhanced microwave tunability in ferroelectric thin films
a high-resolution HAADF image of BTS850 along [001] crystallographic direction with corresponding b and c FFTs taken from selected area with orange dashed square. Two extra spots are marked with white arrowheads. d, e High-resolution HAADF images from different areas of the sample, corresponding to the FFT patterns shown in (f, g), respectively. h HAADF and i ADF of grain along [001] BTS850 crystallographic direction; a few nanodomains are marked with dashed circles. j HAADF and k ADF of the enlarged images of selected domain (yellow dashed circle), and corresponding line profiles (red dashed line and indigo solid line in k) shown in l reveal the reduced intensity of Ba and Ti/Sn atomic columns compared with similar columns in the surrounding areas. m HAADF and n ADF of a grain imaged along [110] with multiple twinning, showing parts with three different [100] orientations.
