Fig. 5: The operando synchrotron projection X-ray microscopy (PXM) characterization on Zn deposition. | Nature Communications

Fig. 5: The operando synchrotron projection X-ray microscopy (PXM) characterization on Zn deposition.

From: Cluster level entropy enhancement in neutral acetate electrolytes enables economical and durable zinc air batteries

Fig. 5: The operando synchrotron projection X-ray microscopy (PXM) characterization on Zn deposition.

a Illustration of the measurement setup for the PXM characterization. b Operando images of Zinc plating in ZN3A5·10H2O (left) and c ZN3A5·10H2O-EE (right) electrolyte. d Morphological evolution of single Zn active nuclei particle in ZN3A5·10H2O and e ZN3A5·10H2O-EE.

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