Fig. 2: Structural characterization of as-deposited and annealed samples by XRD and XRR analyses.
From: Improving interfacial thermal conductivity by constructing covalent bond between Ga₂O₃ and SiC
a XRD patterns and (b) Measured and fitted XRR curves of the as-deposited and annealed samples. c–e The extracted XRR data for the corresponding layers and the error bars represent standard deviation.
