Fig. 3: Orientation distribution and angle-resolved polarized Raman spectroscopy (ARPRS) anisotropic characterization of two-dimensional (2D) CrOCl.
From: Chemical vapor deposition growth of continuous monolayer antiferromagnetic CrOCl films
a Atomic structure of the mica substrate showing sixfold symmetry (green dotted arrow). Three red solid arrows represent the growth direction of the sample. b Optical microscopic (OM) image of CrOCl nanosheets grown on mica, with the three primary orientations marked by yellow, blue, and red arrows. c Statistical orientation distribution of CrOCl nanosheets on mica. d OM image of a typical CrOCl thin flake on a SiO2/Si (300 nm) substrate. e Polarized Raman spectra in parallel (XX) and perpendicular (XY) configurations. f–k Polar plots of Raman intensity for Ag1, Ag2, and Ag3 modes under (f–h) parallel and (i–k) perpendicular configurations. The dots and lines represent experimental data and fitted curves, respectively.
