Fig. 3: Distribution of fragments in PEDOT:PSS.
a, b Time-of-flight secondary ion mass spectrometry (ToF–SIMS) depth profiles of C2H4O, S, and InO for PEDOT:PSS with or without Triton X-100 on glass/indium tin oxide (ITO). c, d X-ray photoelectron spectroscopy (XPS) measurements on the surface of PEDOT:PSS thin film with or without Triton X-100, showing the core level peaks of S 2p. The deconvoluted profiles were fitted with two symmetric/asymmetric Gaussian-Lorenzian functions representing sulfur atoms from styrene sulfonate (170–166 eV, red gradients) and EDOT thiophene (166–161 eV, navy gradients). e S 2p region from XPS depth profiling measurements for pristine PEDOT:PSS thin film and (f) for that with Triton X-100. The core level peaks of S 2p for PSS and PEDOT are separated with white dashed line.
