Fig. 6: Preferential melting along intracrystalline interfaces. | Nature Communications

Fig. 6: Preferential melting along intracrystalline interfaces.

From: Nanostructures as indicator for deformation dynamics

Fig. 6

High magnification images taken in different modes at the transmission electron microscope (TEM) of a large orthoclase grain. White arrows mark lenticular zones that show the same brightness contrast as the amorphous material surrounding the orthoclase grain. STEM scanning transmission electron microscopy, BF bright field, HAADF high-angle-annular dark-field, TEM transmission electron microscopy.

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