Fig. 4: Charge recombination characterization and film-depth dependent probing.
From: Intrinsic light reflection of conjugated films towards high-performance organic solar cells
a Contour map of femto-second transient absorption (fs-TA) results of PM6:Y6 devices with different active layer thickness. b Exciton lifetimes of PM6:Y6 devices with different active layer thickness extracted from ground state bleaching (GSB) signals at 630 nm and 807 nm for PM6 and Y6, respectively. c transient photovoltage (TPV) and d transient photocurrent (TPC) measurement results and the corresponding fitted lifetimes of PM6:Y6 devices with different active layer thickness. e Contour map of film-depth-dependent exciton generation rate simulated from the film-depth-dependent light absorption spectroscopy (FLAS) measurements. The “vertical-lines” in the contour are due to the characteristic of AM1.5G solar spectra. Source data are provided as a Source Data file.
