Fig. 4: Adhesion of single atom Ru-supported (Ru SA)-rGO/SAM to Cu.

a Schematic diagram of tape adhesion test. b AFM image of the interface between Cu/Ru SA-rGO/SAM and SiO2. c AFM image of the Cu/Ru SA-rGO/SAM structure. SEM images of d Cu/SiO2 and e Cu/Ru SA-rGO/SAM/SiO2 after annealing at 500 °C for 30 min. Source data are provided as a Source Data file.