Fig. 7: High-resolution characterization of oxide nanoparticles.
From: The mechanisms underlying the enhanced high-temperature properties of GRX-810
Atomic-scale STEM micrographs of oxides found in GRX-810 a revealing faceted oxide faces and b trigonal crystal structure. c The fast Fourier transformation from b supporting the trigonal crystal structure. d A comparison of the oxides in NiCoCr-ReB and GRX-810 using synchrotron-based high-energy X-ray diffraction confirms the presence of trigonal oxides in GRX-810 and cubic oxides in NiCoCr-ReB ODS. e DFT calculations for the energy difference between cubic, monoclinic, and trigonal phases of Y2O3 as a function of substitutional defect concentration. f The size distribution of oxides in NiCoCr-ReB ODS and GRX-810 using high-resolution scanning transmission electron microscopy. The fit curves represent the best-fit linear equation.
