Fig. 2: Characterizations of perovskite films deposited on SAMs.

a The XRD patterns, b The GISAXS images, c, d SEM, e The cross-section SEM and f AFM images of perovskite films on the control and target SAMs.

a The XRD patterns, b The GISAXS images, c, d SEM, e The cross-section SEM and f AFM images of perovskite films on the control and target SAMs.